Magnetometer

Magnetometer

  • Characterization

    1. Certificate of Nanotechnology

    2. 2019/02/19
    3. 2022/02/20

    1. NanoScale Certification

    2. 2019/02/19
    3. 2022/02/20
Introduction Application Specification Advantage Of Using Nanotechnology Manual And Maintenance Safety And Package

Magnetic properties are of the most important and intriguing features of materials which have been the object of numerous studies so far. Nowadays, its usage has been exploited in many ways and forms, helping various industrial, laboratorial and everyday life's needs to be satisfied. The widespread use of magnetic material and properties has broadened its research area in basic science (physics, chemistry and material science) as well as engineering practices (electronic, computer and telecommunications). Magnetic nanowires, data read/write heads (nanostructures with GMR features) and modern data recording systems are just few examples of today's usage of magnetic materials.    

Researches on magnetic properties require devices and methods capable of precise and reliable measurements thereof. One of the main devices for measuring magnetic properties is magnetometer, an instrument used to calculate the magnetization of materials—both in direction and magnitude.

The magnetometers' performance relies on different mechanisms, one of which is a mechanism called Alternative Gradient Field Magnetometer (AGFM). Compared to other mechanisms, the AGFM has a premium sensitivity in measuring of characteristic parameters of magnetic thin films and magnetic nanowires (even with magnetic contents less than 0.0001 g/cm‌2). The schematic illustration of AGFM's mechanism consists of a coil, a main magnet, a piezoelectric, a sample to be measured, a quartz rod and an anti-vibration container.

In AGFM systems, a magnetic field gradient is used for creating and applying an alternating force on a sample. The sample firmly placed on a stage, therefore, begins to vibrate in accordance to the magnetic field frequency. These vibrations is sensed by the stage, recorded with the aid of piezoelectric actuator and then converted to the electrical signals (alternating voltage in µV scale). Thereafter, a boosting module becomes responsible for amplifying the electrical signals and refining/removing mechanical, acoustic and electrical noise. The boosted and refined electrical signal now can be read and interfered as characteristic features of the sample. The amplitude of the measured voltage can be one of the characteristic features which is proportional to the magnetization of the magnetic sample.

  • Measuring the hysteresis loop in magnetic materials
  • Measuring the primary magnetization curve
  • Measuring and plotting DCD curve
  • Measuring and plotting IRM curve
  • Measuring magnetic attraction

This unit is designed and manufactured by integration of two magnetometers of AGFM and VSM. The unit is capable of measuring magnetic parameters of samples with magnetization as low as 0.0001 emu. The operating domain of two magnetometers (AGFM and VSM) is the same, but the measuring methods differ. This system also provides the possibility of magnetostatic studies for its user. Details of technical specifications are presented in the following Table.

 

Todays, the magnetometers systems is able to measure magnetic properties of sample with magnetization as low as 0.0001 emu. This wide measuring limit is able to measure magnetic properties of thin films, nanopowders and bulk materials.

  • First turn on power supply by pressing power switch (Green ON), then press the Enter key on the keyboard and choose Computer Control. The magnetometer will be ready for conducting instructions from the Computer Control by enabling output contactor.
  • Turn on computer and electronic systems to put the magnetometer systems into warm-up mode (this process may take up to 30 minutes).
  • Open the cooling water inlet valve (ensure that a flow of water is present in the coils).
  • Magnetic sample must be installed on an appropriate probe according to the type of the sample. Two different types of probe are available in the MDK6 toolbox.
  • Both the bulk and thin film sample can be prepared in the form of either square or circular shapes with a side/radius of 3, 4 and/or 5 mm. The sample thickness should not exceed 1~2 mm. For each sample shape, the suited probe is available in the toolbox. The sample must be placed on the suited probe, then with the aid of clean Teflon tape, fasten the probe on its stage. The end of Teflon tape must be completely attached to the sample. Now, install the probe on the end of vibration-maker according to the direction of magnetic field (perpendicular or parallel to the sample surface).
  • In case of the measuring magnetization of sample in the unit weight, before installing the sample on the probe, insert the sample weight manually into the computer with a precision of tenth of mg.
  • For more details on how to use the device, refer to the device catalog and user guide
  • The installing place of the system should be entirely free of mechanical vibrations.
  • The installing place of the system must be free of electrical noise. So it is necessary to leave a reasonable distance between the magnetometer system and high electrical currents. It is also necessary for the magnetometer system to be electrically grounded.
  • The flow of cooling water with an appropriate pressure is necessary.
  • The magnetometer system requires safe and single-phase electric power with a minimum power of 60KW.
  • The laboratory for the magnetometer system must have a steady temperature with an appropriate ventilation.
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